Hong-Ou-Mandel Interference for Quantum Imaging
In this research line, we develop quantum imaging techniques based on Hong–Ou–Mandel (HOM) interference of single photons for high-sensitivity characterization of materials. By controlling and measuring the degree of indistinguishability between entangled photon pairs in a HOM interferometer, we encode sample properties into changes in the visibility and depth of the HOM interference dip. In particular, we use narrowband polarization-entangled single-photon sources that generate a broad HOM dip, making the coincidence rate predominantly sensitive to polarization-induced distinguishability. This enables precise, label-free imaging of birefringent samples, allowing us to map local fast-axis orientation and phase retardance with nanometer-scale retardance precision and sub-degree angular resolution while operating at average powers of only a few hundred femtowatts.